K. Lee, Y. Kim, H. Lee, S. Park, Y. Lee, M.-K. Joo, H. Ji, J. Lee, J. Chun, M. Sung, Y.-H. Cho, D. Kim, J. Choi, J. W. Lee, D.-Y. Jeon*, S.-J. Choi*, and G.-T. Kim* (*co-corresponding authors)
"Defect spectroscopy of sidewall interfaces in gate-all-around silicon nanosheet FET"
Nanotechnology, vol. 32, p. 165202, DOI: 10.1088/1361-6528/abd278, 2021-01