[82] "Spatial Degradation Profiling Technique in Self-Aligned Top-Gate a-InGaZnO TFTs Under Current-Flowing Stress"

J. Park, S. Choi, S. J. Myoung, J.-Y. Kim, C. Kim, S.-J. Choi, D. M. Kim, J.-H. Bae, D. H. Kim

"Spatial Degradation Profiling Technique in Self-Aligned Top-Gate a-InGaZnO TFTs Under Current-Flowing Stress"

IEEE Electron Device Letters, vol. 44(1), pp.96-99, DOI: 10.1109/TED.2022.3225838, 2022-12