D. Kim, J. T. Jang, C. Kim, H. W. Kim, E. Hong, S. Ban, M. Shin, H. Lee, H. D. Lee, H.-S. Mo, J. Woo, D. H. Kim
"Read Disturbance in Cross-Point Phase-Change Memory Arrays—Part II: Array Simulations Considering External Currents"
IEEE Transactions on Electron Devices, vol. 70(2), pp.521-5526, DOI: 10.1109/TED.2022.3231807, 2022-12