T. J. Yang, J. Park, S. Choi, C. Kim, M. Han, J.-H. Bae, S.-J. Choi, D. M. Kim, H. J. Shin, Y. S. Jeong, J. U. Bae
"Compact Model of Current Stress-Induced Threshold Voltage Shift in Top-Gate Self-Aligned Amorphous InGaZnO Thin-Film Transistors"
IEEE Electron Device Letters, vol. 43, pp.1685-1688 , DOI: 10.1109/LED.2022.3202992, 2022-8