J.-W. Back, M.-K. Park, H.-N. Yoo, J.-H. Bae, S. Woo, B.-G. Park, J.-H. Lee
"Variability of DRAM Peripheral Transistor at Liquid Nitrogen Temperature"
IEEE Transactions on Electron Devices, vol. 68(4), pp.1627-1632, DOI: 10.1109/TED.2021.3061516, 2021-3