[44] "Spatial degradation profiling technique in self-aligned topgate a-InGaZnO TFTs under current-flowing stress"

J. Park, S. J. Myoung, S. Choi, J.-Y. Kim, C. Kim, S.-J. Choi, D. M. Kim, J.-H. Bae, D. H. Kim*

"Spatial degradation profiling technique in self-aligned topgate a-InGaZnO TFTs under current-flowing stress"

IEEE Electron Device Letters, vol. 44, np.1, pp. 96-99, DOI: 10.1109/LED.2022.3225838., 2022-12