T. J. Yang, J.-H. Kim, J. R. Cho, H. J. Lee, K. Kim, J. Park, S.-J. Choi, J.-H. Bae, D. M. Kim, C. Kim, D.-W. Park, and D. H. Kim*
"Physical model of a local threshold voltage shift in InGaZnO thin-flim transistors under current stress for instability-aware circuit design"
CURRENT APPLIED PHYSICS, vol. 46, pp. 55-60, DOI: 10.1016/j.cap.2022.11.011, 2022-12