T. J. Yang, J.-H. Kim, C. I. Ryoo, S. J. Myoung, C. Kim, J. H. Baeck, J. U. Bae, J. Noh, S.-W. Lee, K.-S. Park, J.-J. Kim, S. Y. Yoon, Y. Kim, Member, IEEE, and D. H. Kim*
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IEEE Transactions on Electron Devices, vol. 70, no. 1, pp. 121-126, DOI: 10.1109/TED.2022.3223642, 2022-11