[27] "Total Subgap Range Density of States-Based Analysis of the Effect of Oxygen Flow Rate on the Bias Stress Instabilities in a-IGZO TFTs"

G. W. Yang†, J. Park†, S. Choi , C. Kim, D. M. Kim, S. -J. Choi, J. -H. Bae, H. Cho, D. H. Kim*(†These authors are co-first authors.)(*Corresponding author)

"Total Subgap Range Density of States-Based Analysis of the Effect of Oxygen Flow Rate on the Bias Stress Instabilities in a-IGZO TFTs"

IEEE Transactions on Electron Devices.,DOI: 10.1109/TED.2021.3130219, 2021-12