[17] "Unscrambling for Subgap DOS in Multilayered MoS2 FETs under DC Bias Stress via Optical Charge-Pumping C-V Spectroscopy"

G. W. Yang, S. G. Seo, S. Choi, D. H. Kim* and S. H. Jin* (*Corresponding author)

"Unscrambling for Subgap Density-of-States in Multilayered MoS2 Field Effect Transistors under DC Bias Stress via Optical Charge-Pumping Capacitance-Voltage Spectroscopy"

IEEE Access, vol. 9, pp. 73090-73102, doi: 10.1109/ACCESS.2021.3081095., 2021-05