[13] "Impacts of Program/Erase Cycling on the Low-Frequency Noise Characteristics of Reconfigurable Gated Schottky Diodes"

W. Shin, D. Kwon, J. -H. Bae, S. Lim, B. -G. Park and J. -H. Lee

"Impacts of Program/Erase Cycling on the Low-Frequency Noise Characteristics of Reconfigurable Gated Schottky Diodes"

IEEE Electron Device Letters, doi: 10.1109/LED.2021.3072915., 2021-04