[12] "Observation of Hydrogen-related Defect in Subgap Density of States and Its Effects under Positive Bias Stress in a-IGZO TFT"

J. T. Jang, D. Ko, S. -J. Choi, D. M. Kim, and *D. H. Kim(* Corresponding author)

"Observation of Hydrogen-related Defect in Subgap Density of States and Its Effects under Positive Bias Stress in amorphous InGaZnO TFT"

IEEE Electron Device Letters, doi: 10.1109/LED.2021.3066624., 2021-03