[47] "Investigation of dynamic NBTI of 1x-nm DRAM peripheral PMOS transistors for cryogenic memory applications"

H. Y. Bang, H. J. Lee, J. Park, J. Hong, S. Lee, D. H. Kim*

"Investigation of dynamic negative bias temperature instability of 1x-nm DRAM peripheral PMOS transistors for cryogenic memory applications"

The 30th Korean Conference on Semiconductors,2023-02