[43] "Characterization of Lateral Trap Distribution in a-IGZO TFTs through C-V Technique Combined with Extended Channel Conduction Factor"

H. B. Yoo, H. Kim, J. Ryu, J. Y. Park, S. H. Han, H.-I. Yang, J.-H. Bae, S.-J. Choi, D. H. Hwan, D. M. Kim*,

"Characterization of Lateral Trap Distribution in a-InGaZnO TFTs through Capacitance-Voltage Technique Combined with Extended Channel Conduction Factor"

The 30th Korean Conference on Semiconductors,2023-02