[39] "Extraction Technique for Characteristic Parameters in Si MOSFETs through the Dual Sweep Current-to-Transconductance Ratio"

J. Y. Park, H. B. Yoo, H. Kim, J. H. Ryu, S. H. Han ,J. Bae, S. Choi, D. H. Kim and D. M. Kim*

"Extraction Technique for Characteristic Parameters in Si MOSFETs through the Dual Sweep Current-to-Transconductance Ratio"

The 30th Korean Conference on Semiconductors, 2023-02