S. Lee, G.-W. Yang, S. Choi, J. Hong, S. Lee, and D. H. Kim*
"Random telegraph noise-based analysis of electron traps in the cryogenic operation of sub 30-nm DRAM cell array transistors"
The 30th Korean Conference on Semiconductors, 2023-02
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[38] "Random telegraph noise-based analysis of electron traps in the cryogenic operation of sub 30-nm DRAM cell array transistors"
[38] "Random telegraph noise-based analysis of electron traps in the cryogenic operation of sub 30-nm DRAM cell array transistors"
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