[28] "Photonic Capacitance-Voltage Technique with Empirical Distributed Capacitance Model for Characterization of Traps in AOS TFTs"

J. H. Ryu†, H. B. Yoo†, H. Kim, J. Y. Park, J.-H. Bae, S.-J. Choi, D. H. Kim, and D. M. Kim*

"Photonic Capacitance-Voltage Technique with Empirical Distributed Capacitance Model for Characterization of Traps in AOS TFTs"

The 29th Korean Conference on Semiconductors, 2022-01