S. J. Myoung, C. I. Ryoo, J.-H. Kim, J.-H. Bae, S.-J Choi, D. M. Kim, and D. H. Kim*
"Correlation of the lateral profile of carrier concentration and DL to VT, and its dependence on oxygen content in IGZO TFTs"
The 29th Korean Conference on Semiconductors, 2022-01