Y. Lee, J. Yoon, K. Lim, B. Choi, G.-W. Park, J. W. Jeon, J.-H. Bae, D. M. Kim, D. H. Kim, E. Kwon, S.-J. Choi*"Vertical and lateral charge losses during short time retention in 3-D NAND flash memory"EEE 51th ESSDERC, 2021-09